Keithley 4200A-SCS 参数分析仪

Keithley 4200A-SCS 参数分析仪

使用 4200A-SCS 加快半导体设备、材料和工艺开发的探索、可靠性和故障分析研究。最高性能参数分析仪,提供同步电流-电压 (I-V)、电容-电压 (C-V) 和超快脉冲 I-V 测量。

直流电流-电压
(I-V) 范围

10 aA - 1A
0.2 µV - 210 V

电容-电压
(C-V) 范围

1 kHz - 10 MHz
± 30V 直流偏置

脉冲 I-V
范围

±40 V (80 V p-p),±800 mA
200 MSa/s,5 ns 采样率

 

Keithley 4200A-SCS 参数分析仪

洞察参数 快速清晰

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大胆发现从未如此容易。4200A-SCS 参数分析仪可将检定和测试设置的复杂程度降低高达 50%,提供清晰且不折不扣的测量和分析功能。另外,嵌入式测量专业知识(业界首创)可提供测试指南并让您对结果充满信心。

特点

  • 内置测量视频采用英语、中文、日语和韩语
  • 使用数百个用户可修改应用测试开始您的测试
  • 自动实时参数提取、数据绘图、算数函数

测量、切换、重复。

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4200A-CVIV 多通道切换模块自动在 I-V 和 C-V 测量之间切换,无需重新布线或抬起探头端部。与竞争产品不同,四通道 4200A-CVIV 显示器提供本地可视查看,可快速完成测试设置,并在出现意想不到的结果时轻松排除故障。

特点

  • 无需重新布线即可将 C-V 测量移动到任何设备终端
  • 用户可配置低电流功能
  • 个性化输出通道名称
  • 查看实时测试状态

检定、自定义、最大化。

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简单地说,4200A-SCS 可以完全自定义且全面升级,您可以对半导体设备、新材料、有源/无源组件、晶片级可靠性、故障分析、电化学或几乎任何类型的样本执行电气检定和评估。

特点

  • NBTI/PBTI 测试
  • 随机电报噪声
  • 非易失内存设备
  • 稳压器应用测试

带分析探测器和低温控制器的集成解决方案。

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4200A-SCS 参数分析仪支持许多手动和半自动晶片探测器和低温控制器,包括 Cascade MicroTech、Lucas Labs/Signatone、MicroManipulator、Wentworth Laboratories、MicroManipulator、LakeShore Model 336 低温控制器。

特点

  • “点击”测试定序
  • “手动”探测器模式测试探测器功能
  • 假探测器模式无需移除命令即可实现调试

 

Model 电流-电压 (I-V) 范围 电容-电压 (C-V) 范围 脉冲 I-V 范围 Buy online List Price
4200A-SCS 10 aA - 1A
0.2 µV – 210 V
1 kHz – 10 MHz ±40 V (80 V p-p),±800 mA
200 MSa/s,5 ns 采样率
- 配置与报价
Model4200A-SCS
电流-电压 (I-V) 范围电容-电压 (C-V) 范围脉冲 I-V 范围
10 aA - 1A<br/> 0.2 µV – 210 V1 kHz – 10 MHz±40 V (80 V p-p),±800 mA<br/> 200 MSa/s,5 ns 采样率

Semiconductor Reliability

Perform complex reliability tests while letting the 4200A-SCS take care of the complex coding. Included projects like Hot Carrier Injection Degradation (HCI) give you a jump start on device analysis.

Highlights

  • Combine DC I-V, C-V, and pulse measurements in one set of tests
  • Included support for many probe stations and external instruments
  • Easy to use cycling system allows repeat measurements without coding

C-V Measurement for High Impedance Applications

Use Keithley’s custom Very Low Frequency C-V Technique to analyze the capacitance of your high resistance sample. This technique is performed using only source measure unit (SMU) instruments but can be combined with a 4210-CVU to perform higher frequency measurements as well.

Highlights

  • .01 to 10 Hz frequency range with sensitivity of 1 pF to 10 nF
  • 3½-digit typical resolution, minimum typical of 10 fF

Non-volatile Memory

Put your new technologies to the test with thorough pulsed I-V characterization. The 4200A-SCS comes with support and ready-to-run tests for the latest in NVRAM technologies from floating gate flash to ReRAM and FeRAM. Dual sourcing and measuring capabilities in current and voltage allow both transient and I-V domain characterization.

VCSEL Testing

Multiple, concurrent source measure unit (SMU) instruments in the 4200A-SCS simplify your laser diode testing. Generate LIV (Light intensity-Current-Voltage) curves with connections to only a single box. Advanced probe station and switch support means you can use the same instrument for on-wafer production testing of individual diodes or entire arrays. SMUs can be configured for up to 21 W capabilities for a variety of continuous wave (CW) VCSEL applications.

Nanoscale Device Characterization

The integrated instrument capabilities of the 4200A-SCS simplify the measurement requirements in developing nanoscale electronics such as carbon nanotubes. Start your investigations from a preconfigured test project and expand your work from there. A pulsed source mode for SMUs helps reduce overheating problems can be combined with low voltage C-V and ultra-fast pulsed DC measurements in seconds.

Resistivity of Materials

Use a 4200A-SCS with integrated SMUs to easily measure resistivity using a four-point collinear probe or van der Pauw method. Included tests perform repetitive van der Pauw calculations automatically, saving you valuable research time. A maximum current resolution of 10aA and input impedance of >10­­­­16 ohms give you more accurate and precise results.

MOSFET Characterization

The 4200A-SCS can hold all the instruments necessary for full characterization of MOS devices through component or on-wafer testing. Included tests and projects solve for oxide thickness of a MOSCap, threshold voltages, doping concentration, mobile ion concentration, and more. All these tests can be run at the touch of a button from a single instrument box.

产品技术资料 型号 描述 价格
查看产品技术资料 4200A-SCS-PK1
高分辨率 IV 套件
210V/100mA,0.1 fA 分辨率
对于两端和三端设备,MOSFET、CMOS 检定套件 4200A-SCS-PK1 包括:
  • 4200A-SCS 参数分析仪
  • (2) 4200-SMU 模块
  • (1) 4200-PA 前置放大器
  • (1) 8101-PIV 测试夹具与采样设备
索取报价
查看产品技术资料 4200A-SCS-PK2
高分辨率 IV 和 CV 套件
210V/100mA,0.1 fA 分辨率,1kHz - 10MHz
对于高 K 电解质,深亚微米 CMOS 检定套件 4200A-SCS-PK2 包括:
  • 4200A-SCS 参数分析仪
  • (2) 4200-SMU 模块
  • (1) 4200-PA 前置放大器
  • (1) 4210-CVU 电容-电压模块
  • (1) 8101-PIV 测试夹具与采样设备
索取报价
查看产品技术资料 4200A-SCS-PK3
高分辨率和高功率 IV 和 CV 套件
210V/1A,0.1 fA 分辨率,1kHz - 10MHz
对于功率设备、高 K 电解质,深亚微米 CMOS 设备检定套件 4200A-SCS-PK3 包括:
  • 4200A-SCS 参数分析仪
  • (2) 4200-SMU 模块
  • (2) 4210-SMU
  • (1) 4200-PA 前置放大器
  • (1) 4210-CVU 电容-电压模块
  • (1) 8101-PIV 测试夹具与采样设备
索取报价
查看产品技术资料 4200-BTI-A
超快 NBTI/PBTI 套件
用于使用尖端 CMOS 技术套件进行复杂的 NBTI 和 PBTI 测量4200-BTI-A 包括:
  • (1) 4225-PMU 超快 I-V 模块
  • (2) 4225-RPM 远程前置放大器/开关模块
  • 自动化检定套件 (ACS) 软件
  • 超快 BTI 测试项目模块
  • 电缆
索取报价

 

Data SheetModuleDescription
4200-BTI-A ULTRA FAST BTI PKG
4200-PA REMOTE PREAMPLIFIER MODULE
4200-SMU MEDIUM POWER SOURCE-MEASURE UNIT
4200A-CVIV MULTI SWITCH
4210-CVU CAPACITANCE-VOLTAGE UNIT
4210-SMU HIGH POWER SOURCE-MEASURE UNIT
4220-PGU 双通道脉冲发生器
4225-PMU ULTRA-FAST PULSE MEASURE UNIT
4225-RPM REMOTE PREAMPLIFIER/SWITCH MODULE
TitleTypeDate
4200A-SCS 参数分析仪 - 产品技术资料

Literature number: 1KC-60780-2
Datasheet 14 Sep 2017
Model 4200A Parameter Analyzer User's Manual
This User's Manual includes specific applications to help you get started quickly.
Part number: 4200A-900-01B
Primary User 28 Aug 2017
Model 4200A-SCS-PK2 Parameter Analyzer Quick Start Guide
The Quick Start Guide for the Keithley Instruments 4200A-SCS-PK2 provides unpacking and basic connection information. It also provides sample tests that you can use to familiarize yourself with the Parameter Analyzer.
Part number: 4200A-PK2-903-01A
Primary User 28 Aug 2017
Model 4200A-SCS Package 3 System Quick Start Guide
The Quick Start Guide for the Keithley Instruments 4200A-SCS-PK3 provides unpacking and basic connection information. It also provides step-by-step examples to allow you to familiarize yourself with the Parameter Analyzer.
Part number: 4200A-PK3-903-01A
Primary User 28 Aug 2017
Model 4200A-SCS Semiconductor Characterization System Quick Start Guide
Brief introduction to the Keithley Instruments 4200A-SCS Parameter Analyzer, including unpacking and initial connection information.
Part number: 4200A-903-01A
Primary User 28 Aug 2017
Model 4200-Compiler Installation Instructions
Installation instructions for the Model 4200-Compiler, a compiler that you can use to create user modules for the 4200A-SCS Parameter Analyzer and the 4200-SCS.
Part number: PA-1030E
Combined User/Service 28 Aug 2017
Modèle 4200A-SCS Liste d'Avertissements
List of documentation warnings for the Canadian market that are in both English and French.
Part number: 077126000
User 28 Aug 2017
Model 4200-SCS Semiconductor Characterization System Declassification and Security Instructions
If you have data security concerns, this document tells you how to clear or sanitize the Keithley Instruments Model 4200-SCS Semiconductor Characterization System's memory devices. It also explains how to declassify an instrument that is not functioning.
Part number: 077134300
Declassification 28 Aug 2017
Model 4200A-SCS Declassification and Security Instructions
If you have data security concerns, this document tells you how to clear or sanitize the Keithley Instruments Model 4200A-SCS Parameter Analyzer's memory devices. It also explains how to declassify an instrument that is not functioning.
Part number: 077126200
Declassification 28 Aug 2017
4200A-SCS Parameter Analyzer Release Notes
The 4200A-SCS Clarius+ software application suite is the initial release of the software for the 4200A-SCS. Clarius+ software requires Microsoft Windows 7 on your 4200A-SCS Parameter Analyzer
Part number: 077132601
Release Notes 28 Aug 2017
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