随着不断增加的 DDR SDRAM 时钟频率和信号边沿速率，信号完整性和总线状态验证技术对于 DDR 内存设计取得成功越来越重要。本应用指南重点介绍触发和解码命令总线、隔离读取/写入信号以及各种内存信号完整性测量的技术。
本研讨会将说明如何为基于下一代 DDR 的内存测试做好准备。了解这些新标准为电气验证带来的变化以及如何为 LPDDR3 和 DDR4 内存系统准备正确的信号访问。了解高级知识，为执行基于这些新兴标准的电气验证测试规划所需的适当仪器选型。
|DesignCon 2015 Paper - Designing High Performance Interposers with 3-port and 6-port S-parametersThis technical paper explains how multiport S-parameters can be used to validate memory interposer design cases. This helps memory designers understand some of the performance characteristics that can be inferred from S-parameters, as well as some of the interactions between the interposer and the device under test and probing system; leading to more accurate validation efforts on very fast memory systems utilizing DDR4 or LPDDR4.|
|New Characterization Techniques for DDR4/LPDDR4 and Next Generation Memory Standards|
This webinar provides an update on the latest characterization and debug techniques to enable analysis of the highest DDR4/LPDDR4 speed grades (DDR4-3200/LPDDR4-4266).
|Efficiently Design and Electrically Validate a DDR4 Interface|
This webinar will show how Cadence and Tektronix can enable you with flexible and power efficient DDR4 IP, design and analysis tools used in the office, and lab-based solutions to address the key challenges in electrical validation of the DDR4 interface.
|Memory Interface Verification and Debug|
This webinar will explain how to prepare for next generation DDR-based memory testing. Learn about the changes these new standards bring to electrical verification and how to prepare for proper signal access to LPDDR3 and DDR4 memory systems. Get advance knowledge to plan for proper instrument selection needed for performing electrical verification tests on these emerging standards.