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Eyes Wide Open: ON Semiconductor Employs TDS8200 as ‘Golden Reference’ for Testing Emerging Serial Data Standards


Challenge: Accurately characterize jitter produced by clock and data signals within ECL devices that operate from 3-12 Gigabits per second (Gb/s). Previous generations of instruments could not accurately measure below 1 ps.

Solution: Tektronix TDS8200 high-performance digital sampling oscilloscopes, capable of measuring jitter at < 200 fs (typical).

Benefits: With industry-leading jitter measurement capabilities, the TDS8200 helped ON Semiconductor fully characterize the performance of its devices, reducing the burden on its customers' jitter budgets and enabling more complex designs.