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Keithley and Novellus to Develop Automated Diagnostic Tests


Cleveland, Ohio and San Jose, California -- April 2, 2003 -- Keithley Instruments, Inc. (NYSE:KEI), the leader in electrical parametric test for wireless and mobile communications ICs, and Novellus Systems, Inc. (Nasdaq:NVLS), the productivity and innovation leader in advanced deposition, surface preparation and chemical mechanical planarization (CMP) processes for the global semiconductor industry, today announced that they have formed a collaboration at Novellus' Customer Integration Center in San Jose.