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MITEC, Kuala Lumpur, Malaysia

The semiconductor value chain is increasingly defined by tighter tolerances, growing process complexity, and near-zero margin for error. From material engineering and IC design to wafer fabrication, assembly, and test, every stage demands precision, stability, and confidence.

As part of Ralliant, Tektronix, Gems, Setra, Dover Motion, and Qualitrol will be exhibiting at SEMICON Southeast Asia 2026.

Visit us at Booth #2137 to explore integrated solutions across four critical areas:
- Precision DC and AC Characterization
- Precision Process Control
- Precision Motion Control
- Energy Resilience and Reliability

Connect with our team to discover how we enable precision and confidence at every stage of the semiconductor value chain.

Do you know that Tektronix releases quarterly firmware updates for our beloved 4, 5 and 6 Series Mixed Signal Oscilloscope? We continuously gather your feedbacks and comments as we know that your measurement needs are ever-evolving. The firmware update will make sure that your voice and needs are taken care of.

Join this session and learn what are the latest addition that we have for your oscilloscope:
- New Features
- New Serial Bus Support
- New Applications
- Bug Fixes

Register today!

As battery-powered devices have become a staple of everyday life, battery performance has become a critical factor in device design. Due to the criticality of battery performance, along with the wide range of battery types, test and design engineers working with battery powered devices need a faster way to optimize their device’s performance and battery life.

When Keithley’s KickStart Software, and the KickStart Battery Simulator App is paired with the 2281S, battery model generation becomes simple. KickStart Software’s intuitive interface, model editing abilities, and battery model repository allow the test and design engineer to create battery models at different conditions and test their device against these various models quickly.

Join us for this live webinar to learn more on Keithley solution today!

Measurements and analysis on three-phase power systems are inherently more complex than on single-phase systems. Although oscilloscopes can capture voltage and current waveforms with high sample rates, further calculations are required to produce key power measurements from the data.

Learn how Inverter Motor and Drive Analysis (IMDA) software from Tektronix makes it easier than ever to perform three-phase analysis and correlation of control timing and power output characteristics on devices such as AC induction motors, permanent magnet synchronous motors (PMSM), and brushless DC (BLDC) motors. Sign up to watch on demand.

In the field of semiconductor material research and device testing, a crucial aspect is to determine the resistivity and Hall voltage of a given sample.

The Van der Pauw method is a widely used technique for assessing the resistivity. With the 4200A-SCS parametric analyzer, researchers can benefit from a built-in test module, eliminating the need for programming and automation, and enabling them to concentrate on comprehending the materials.

This webinar will provide insights into measuring resistivity and Hall voltage using the Van der Pauw method and how to conduct this test effortlessly by using the 4200A-SCS parametric analyzer.

Join us for this FREE webinar today!

４回にわたってソースメータ(SMU)による試験効率化の方法を徹底解説ソースメータ（SMU）とは？
車載Ethernet 電源やマルチメータと何が違う？皆様からよく頂くご質問にお答えし、SMUの基礎から測定実例や応用アプリケーションなどを交えた入門セミナがオンデマンドでご視聴いただけます。 より深くご理解頂くために、４回にわたって、仕組みから様々な測定事例までSMUによる試験効率化の方法を徹底解説しています。ぜひご視聴ください。

• 実機デモで比較解説 ー SMUのDC電源／電子負荷性能について
• SMUの仕組みとよく使われる機能のご紹介
• SMUを使った代表的な測定事例のご紹介
• ソフトウェアを使ったSMUの自動計測事例

PCI Express I/O bandwidth has doubled every 3 years on average thereby leading to an increased demand for this full duplex high speed bus architecture. As the industry begins deploying the 5.0 revision with a bit rate of 32 GT/s, new trends and guidelines emerge for receiver compliance and validation.

This webinar will provide an overview of the methods for solving some of the new test and measurement receiver challenges for PCIE® 5.0 at 32.0 GT/s. The key topics covered in this presentation are as follows:
- Status of 5.0 specifications including Base, CEM, and the test specifications
- PCI-SIG® 5.0 compliance program
- Challenges and latest guidelines on 32 GT/s receiver testing from industry experts
    * Nuances of the 32 GT/s stressed eye calibration
    * Handling high loss backchannels with equalization
    * Thoughts on Rx testing with and without spread spectrum clocking (SSC)
- Solving validation challenges with a receiver solution from Anritsu & Tektronix
- PCI Express, PCIE, and PCI-SIG are registered trademarks and/or service marks of PCI-SIG.

Register to watch the on-demand webinar today!

Are the bit errors in your data caused by the power supply or sources inside the digital channel?

Let's end the dispute by examining the connection between jitter and power integrity. We'll highlight sources of noise likely to cause jitter on serial data lines and look at other power analysis methods from 3-phase inverter analysis to isolated probing.

In this on-demand webinar, will learn how to:
- Detect ripple and its effects on a high-speed serial clock using power rail analysis software
- Mitigate signal integrity problems caused by the PDN (power distribution network)
- See how additional capabilities of modern oscilloscopes make complex power measurements easier and more repeatable