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  • 技术文档 文档类型 发布日期
    Using AI Agents to Build Instrument Scripts for More Efficient ATE
    This technical brief examines the use of generative artificial intelligence agents to accelerate the development of on‑instrument automation scripts for automated test equipment (ATE). It focuses on the application of large language models (LLMs) and …
    技术简介
    Hardware-Enforced PSU Protection for High-Throughput DUT Testing with MP5000
    High-density validation and production test systems place strict demands on power delivery, fault response, and system uptime. When a fault occurs, protection mechanisms must act deterministically and locally - without relying on host software or …
    技术简介
    Easy Data Export with TSP Toolkit
    This technical brief discusses the Data Export feature of the TSP Toolkit extension and how to quickly and easily get data from TSP-enabled instrumentation to a PC.
    技术简介
    Sequencing Power Supply Outputs with the MP5000
    Introduction Power supply output sequencing is the process of controlling the order and timing of when voltage is supplied to a device under test (DUT) using multiple power supply channels. Many modern electronic devices, such as ASICs, FPGAs, and …
    技术简介
    Synchronizing Parallel Testing with the MP5000 Series
    Introduction Growth in the semiconductor chip market, driven by the rapid advancements in AI and the widespread shift toward electrification, has required manufacturers to increase throughput on testing and validation without sacrificing test …
    应用指南
    Accelerate Automation: Effortless Script Generation with TSP Toolkit
    Adopting a new instrument or command set can be daunting and pose a unique set of challenges. Engineers, researchers, and system integrators alike must contend with a typically time-consuming learning curve when choosing to take on new technologies …
    应用指南
    Advantages of Interlock System on the MP5000 Series
    Enabling Safe, Confident Testing in Power Semiconductor and Discrete Device Characterization As voltage and current levels increase to meet the demands of advanced power devices, the risk of electric shock, arc-over, or accidental misconfiguration …
    技术简介
    Getting Started with the MP5000 Series Modular Precision Test System and Test Automation
    Introduction Validation Engineers, Production Test Engineers, and System Integrators are often tasked with developing automated test equipment (ATE) systems, which are widely used for testing various semiconductor devices, such as transistors, diodes …
    技术简介
  • Introducing the MP5000 Modular Test System that enables users to mix and match Power Supply Units and Source Measurement Units in the same mainframe with up to 6 output channels.
    时长: 1m 7s
    This quick demo video will guide you through some of the key features of the Tektronix TSP Toolkit, available as a download on the Visual Studio Code Marketplace. Video Content: 00:10 Access Test …
    时长: 2m 35s
    A behind-the-scenes look and hear from the engineers who built the MP5000 Modular source measure unit and power supply test system, designed to help you test what’s next with confidence.
    时长: 3m 55s
    The MP5000 modular test system operation overview and technical features description to learn how this flexible, high-throughput PSU and SMU capable platform can accelerate your validation or …
    时长: 4m 19s