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应用指南

Long Term Data Collection and Breakdown Testing Using the 4200A-SCS Parameter Analyzer

This application note provides an overview of the Data Compression feature introduced in Clarius V1.14 for the 4200A-SCS …
应用指南

Forced Current Quasistatic C-V Methods for SiC Devices

This application note describes the Force-I QSCV technique and explains how to use the tests with Clarius Software V1.14 …
Blog

Calibration Methods & Best Practices: Ensuring Quality and Efficiency

As a Tektronix we understand the critical role that calibration plays in maintaining the accuracy and reliability of …
Blog

Ensuring Measurement Compliance in the Semiconductor Industry

Introduction In the semiconductor industry, precision and accuracy are paramount. Engineers across various …
How-To

How to Use Oscilloscope Cursors and Callouts for Easy Waveform Annotation

Often, when using an oscilloscope, one needs to make quick on-screen measurements and add notes to waveforms. Cursors …
Blog

Test and Measurement in the Quantum Era

From an engineer’s perspective the continuous advancement of quantum hardware and technologies is amazing. My interest …
Blog

Efficiently and Easily Test Fuel Cells

One fuel cell type at the cornerstone of modern clean energy solutions is hydrogen fuel cells. They convert chemical …
Blog

Perform More Tests and Increase Throughput with High-Power, 3-Channel Bidirectional …

They are common challenges every test engineer is likely to face at some point: production demand is outpacing the …
Blog

As Time-to-Market Windows Shrink, Engineers Need New Instruments to Keep Up. Tektronix …

By Eric Yang Whether you’re building IoT devices, next generation mobile devices, or advanced automotive sensors, chance …
Blog

Recreating Real-World Chaos with Arbitrary Waveform Generators

When testing complex electronic warfare and wireless communications systems, engineers and researchers need the …
Blog

One Instrument for Generating Analog, Digital and RF Signals; No Compromises on …

How often, as an engineer, do you have to cross over into the unknown? There is no shortage of new information domains …
Blog

Use EA’s Arbitrary Function Generator to Output Custom Voltage or Current Waveforms

Whether you are a seasoned engineer or are relatively new to electronic testing, it’s vital that you have the right …
Blog

Understanding How To Analyze Jitter

Steve Sandler, President of Picotest, as well as Maria Agoston, Cameron Lowe, Tony Ambrose, all of Tektronix, also …
Blog

Automotive Game Changer? ECU Changes on the Horizon

Automobile of the future EE Times recently published an article, VW All-In For a Change: Will Bring HW + SW Design …
Blog

Spectrum View: A New Way of Analyzing Signals Across Multiple Domains

Analyzing Signals Across Multiple Domains There is increasing interference in the RF domain as we work to make IoT …
成功案例

Fast 3D EMC/EMI Scan with Detectus Scanning System and Tektronix Real Time Spectrum …

This customer case study reviews how the Eggtronic team used a Tektronix real-time spectrum analyzer to enable an …
应用指南

Characterizing Self-Generated EMI for Wireless and IoT Products with 4, 5 or 6 Series …

Learn how to use near-field probes and spectrum analysis on 4, 5 and 6 Series MSOs to look for potential sources of self …
技术简介

Tek Care Repair Plan

Tek Care plans provide fast, high quality services at a fraction of the cost of on-demand service events.
Blog

PCIe Gen 5 Testing Challenges – Spread Spectrum Clocking (SSC)

Spread Spectrum Clocking (SSC) is a highly effective technique utilized to reduce electromagnetic interference or EMI …
Blog

Convenient and cost-effective EMI pre-compliance testing

How do you deal with electromagnetic interference (EMI) when you don’t know where it’s coming from and in what form it …

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