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常见问题

常见问题
How to measure Temperature Coefficient of Resistance (TCR)?
The Temperature Coefficient of Resistance, or TCR, is a measurement of a resistor's change in resistance per change in temperature. It is typically measured in ppm/°C, that is, parts-per-million change in ohms per change of 1 degree centigrade. Common …

此常见问题适用于:
783033
What is the bandwidth of Spectrum View on the MSO4/5/6?
Spectrum View is a unique approach to frequency domain analysis present on some Tektronix oscilloscopes that allows you to simultaneously examine time and frequency aspects of a single signal. Learn more about Spectrum View here.  The minimum bandwidth of …

此常见问题适用于:
783032
KickStart Battery Simulator App FAQs
What benefits does the KickStart Software Battery Simulator App provide? The new Battery Simulator App includes: Ability to generate, edit, and simulate custom battery models using the 2380 E-load, 2281S Battery …

此常见问题适用于:
783031
Faq


此常见问题适用于:
783022
How do I create a single pulse with SourceXpress?
Creating single pulses for your Arbitrary Waveform Generator in SourceXpress simply requires some consideration to your AWG’s sample rate, and a waveform file. Remember the time of any signal output by an AWG = the sample rate of the AWG / the number of …

此常见问题适用于:
783021
What are the differences between the TBS1000C and TBS1000B?
Enhancement: Longer record length for 20k compared to 2.5k on the B model scope 10 x 15 divisions graticule area compared to 8 x 10 on the B model scope Cursor support with on screen readouts in math FFT Improved noise level Vertical …

此常见问题适用于:
783020
SourceMeter or Source Measure Unit (SMU)?
A Source Measure Unit, shortened to SMU, is a particular class of instrument. Think of this phrase on the same level as oscilloscope or digital multimeter. They might also be known as source monitor units, source-measurement units, or other phrases that …

此常见问题适用于:
783014
TSG4100A - Output Level Accuracy (IQ modulation relative to CW) test procedure
Here is the revised Output level accuracy (IQ modulation relative to CW) test procedure for TSG4100A.  An updated revision for the specification and performance verification document 077-1078-00 Revision B.   

此常见问题适用于:
783013
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此常见问题适用于:
783013
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此常见问题适用于:
783013