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轻松、专业、完善。
泰克可作为您的团队的扩展，交付定制的校准服务解决方案，这不仅能节省时间，还能节省成本，并可确保电子测试和测量设备的准确性。我们与您密切合作，在增强或外包复杂测试与测量设备的校准方面帮助您做出明智的业务决策。每天，成千上万的公司都依赖泰克以具有竞争力的市场价格提供 OEM 质量级别的校准。
- 服务面向泰克、吉时利、福禄克、Keysight、Rohde & Schwartz、Agilent，以及 9000 多个其他的测试与测量设备品牌
- 定制计划选项：现场、本地、发运到工厂
- 快速、可依赖的周转时间
- 完整系列的 Z540 和 ISO 17025 认证校准
- A2LA 认证技术人员
Customized Wafer Probing
Tektronix employs a team of electrical and mechanical design engineers that can develop customized wafer probe cards and tests to meet the most demanding requirements.For projects requiring wafer processing (e.g., wafer bumping, thinning, dicing), we maintain relationships with a variety of domestic and international industry suppliers and offer supply chain management capabilities to enable a turnkey solution for your microelectronic parts.
As a proven US-based, ITAR-registered supplier to a variety of defense programs and companies, Tektronix Component Solutions is an ideal partner for defense applications requiring high-performance, mission-critical microelectronics. Offering services and products that include wafer test, IC packaging assembly and test, 2.5/3D packaging, and design & simulation, Tektronix Component Solutions has the expertise and capabilities to meet your requirements for high-reliability microelectronics.
With more than 40 years of experience, Tektronix Component Solutions is the stable supplier that you can trust to deliver on long-term military programs.
Trusted, ITAR-Registered Supplier
Tektronix Component Solutions has been accredited by the U.S. Department of Defense (DOD), Defense Microelectronics Agency (DMEA) as a Category 1A microelectronics Trusted Source for IC packaging/assembly and test services – the highest designation awarded by the U.S. Department of Defense. This enables Tektronix Component Solutions to serve U.S. defense customers with classified program requirements. The accreditation certifies that Tektronix Component Solutions meets stringent product control and security standards in providing trusted microelectronic services. Tektronix Component Solutions also holds certifications in ISO9001/ISO14001 and AS9100D and meets all ITAR requirements.
As an on-shore, ITAR-registered supplier, Tektronix Component Solutions has stringent standards in-place to protect and control sensitive information related to defense programs. With many years of experience supporting defense customers and programs, we recognize and adhere to the added level of responsibility in providing microelectronic engineering and manufacturing services to the military.
High-Performance Products and Services
Our military experience spans a variety of critical applications, including communications, avionics, radar, propulsion control, and guidance systems. Tektronix Component Solutions has supplied high-performance and high-reliability products to defense programs such as the F-22 Raptor and F-35 Lightning II (Joint Strike Fighter) with a focus on continual C-SWaP (cost, size, weight and power) improvements.
Having served military and commercial aerospace customers for many years, Tektronix Component Solutions has a deep understanding of the high-reliability requirements of those applications. As such, we fully utilize our unique strength in test to deliver fully-tested parts that have proven to operate successfully in mission-critical environments.
Wafer Probe FAQs
What is a wafer probe?
A wafer probe is a type of probe used in the semiconductor industry to test integrated circuits (ICs) on a wafer. The wafer probe allows for the electrical characterization of individual chips on the wafer.
How does a wafer probe work?
A wafer probe typically consists of a set of needles that make contact with the metal pads on the ICs on the wafer. The needles are connected to a test system that applies electrical signals to the ICs and measures their response. The wafer probe allows for testing of each IC on the wafer before they are separated into individual chips.
What is the purpose of wafer probing?
The purpose of wafer probing is to test the functionality of individual ICs on a wafer before they are packaged and sold. This helps to ensure that the ICs meet the required specifications and are functioning properly before they are integrated into electronic devices.
What are some common wafer probe applications?
Wafer probing is commonly used in the semiconductor industry for a variety of applications, including process control, device characterization, failure analysis, and reliability testing.
What are some types of wafer probes?
There are several types of wafer probes, including manual probes, semi-automatic probes, and fully automatic probes. Manual probes require an operator to manually move the wafer to each test site, while semi-automatic and fully automatic probes can automatically move the wafer to each test site.
What are some factors to consider when selecting a wafer probe?
When selecting a wafer probe, it is important to consider factors such as probe tip size and shape, probe tip material, probe planarity, and probe placement accuracy. Other factors to consider include the number of probes, the size of the wafer, and the required throughput.
What is the difference between a wafer probe and a wafer test?
A wafer probe is a type of probe used to test individual ICs on a wafer, while a wafer test is a more comprehensive test that is performed on a completed wafer to ensure that all of the ICs meet the required specifications.