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高速串行通信

下一代数字接口标准(串行、内存、显示等)会推动如今的一致性和诊断工具的限制,产生高速 Tx 和 Rx 设计挑战,包括:

泰克提供的自动测量套件可加快 PHY 验证周期,并保证一致性。当一致性测量未通过时,可使用协议解码、可视化触发等工具来加速调试。在来源中确定抖动和噪声,如串扰或其他多通道噪声耦合。

标准和技术

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Library

Title
PCI Express®发射机PLL测试 — 不同方法对比
根据使用的测试仪器类型,可以通过多种方法测量PLL环路响应。正如预期的那样,各种方法在测试精度、测试速度(吞吐量)、易用性、设置简便性和购买费用上各有优势和劣势。此外,某些方法存在局限性,不能广泛用于所有类型的PLL。尽管所有方法都可以测试是否满足规范要求,但某些方法为时钟设计人员优化设计提供了额外的实用信息。
检定16G光纤通道速率的SFP+收发机
研究根据16G光纤通道标准测试SFP+收发机所需的测量,同时覆盖多模850 nm接口和单模1310 nm接口。其中包括一个测试和检定实例,采用单模1310 nm激光器SFP+收发机及14.025 Gb/s的16G线速,同时采用一流的测试设备。
高速接口标准
本电子指引将帮助您进一步了解PCIe 4.0、SAS、SuperSpeed USB和DDR4标准测试时面临的设计挑战。在这本电子指引中,您还将快速获得许多技术资源,帮助您了解设计挑战,根据测试需求选择适当的解决方案。
为迎接DVI 一致性测量挑战提供快速高效的解决方案
泰克为您提供了所需的全部DVI测量解决方案,从高带宽数字荧光示波器(DPO)到探头、再到专用软件。泰克解决了许多棘手的测量问题,如抖动和眼图测试,提供了优秀的DVI解决方案,自动完成及简化您的工作。
远程探头采集改善高速串行测量
随着高速串行数据速率不断提高,使测量余量达到最大的需求也在提高。即使质量非常好的同轴电缆也会影响测量余量。示波器远程探头提供了明显的优势,可以使信号完整性测量的余量达到最大。
Probing Tips for High Performance Design and Measurement
When a high performance system or component needs to be verified, it often requires attaching an oscilloscope probe. For high speed circuits, the effect of attaching a probe often cannot be ignored …
This video focuses on the Link Training Status State Machine UI feature of the USB 3.1 Gen2 Receiver test application and shows the path that is taken by a device being trained into loopback mode …
4m 35s
This video highlights some of the newest features and capabilities of the USB 3.1 Receiver testing application. These updates enhance the functionality of the software, and give users more tools …
5m 25s
The USB 3.1 Receiver application's Margin Test feature gives engineers quantitative answers on a design's performance and as a debug tool, a better understanding of where devices fail. This video …
3m 34s
The physical setup for USB 3.1 receiver calibration and testing is shown in this video.
4m 33s
This video details the the BERTScope's Error Location Analysis tool that provides a huge advantage for looking beyond compliance and debug system issues that can cause costly delays in design …
11m 11s
Tackle today's high-speed serial signals and tomorrow's too with the scalable, flexible DPO70000SX series. Watch this short video to see how.
The NEW P7700 Series TriMode Probe provides the highest probe fidelity available for real-time oscilloscopes. Watch our 60-second video to see how this new probe can help minimize noise and easily …
This webinar provides insight into the future of mobile device design and test, with emphasis on the new C-PHY serial bus.
54m 10s
Watch this video to get an overview of the new Link Training Tool, which forms part of the expanded analysis software for Tektronix DPO70000SX oscilloscopes. Link Training helps engineers to …
1m 31s
This short video shows how to debug a compliance measurement that has failed by using Tektronix’ Jitter and Eye Diagram Software, DPOJET. Using DPOJET, engineers can go from a compliance …
Tektronix supports many applications where AWGs are heavily used, with plug-ins that improve overall efficiency by shortening the time it takes to build these complicated application test set-ups …
The Tektronix P7700 TriMode Probe supports solder connections to a device under test. In this video, you will learn the Tektronix recommended procedure for attaching a solder tip to a device.
Title
Demystify MIPI D-PHY and C-PHY Transmitter and Receiver Physical Layer Test
During this webinar, you'll gain an understanding of MIPI test challenges for both MIPI high-speed physical layers. You'll also get useful tips and technical insights into characterizing and …
How to Address Your Toughest Serial Bus Design Challenges with EDA and Measurement Correlation
This Tektronix webinar will teach engineers how to use modeling tools to correlate simulations with high-speed physical layer measurements on Serial Bus Standards using the DPO/MSO70000 Series …