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Serial Communications

Title
Reducing EMI in USB 2.0
How PulseCore Semiconductor turns to Tektronix USB Test Solution to Develop a new IC that enables USB applications to reduce the peak-power USB 2.0 radiated EMI, maintain an unchanged signal …
RC4 Wireless Lights It Up with Tektronix MSO2000 Series
James Smith at RC4 develops custom wireless dimming and control products, for high-profile clients like Cirque du Soleil and Disney. Find out how James used the MSO2024 to shave hours off …
On the Bleeding Edge: Tektronix Logic Analyzers Enable Tundra Semiconductor to Develop First RapidIO Switches and Get to Market Faster
Challenge: Design, verify and debug the industry’s first silicon switches supporting parallel and serial RapidIO® Solution: Tektronix TLA7000 Series logic analyzer with TMS805 RapidIO application …
Logic Analyzer Fundamentals
Like so many electronic test and measurement tools, a logic analyzer is a solution to a particular class of problems. It is a versatile tool that can help you with digital hardware debug, design …
SDH Telecommunications Standard Primer
SONET Telecommunications Standard Primer
What is SONET?This document provides an introduction to the Synchronous Optical NETwork (SONET) standard. Standards in the telecommunications field are always evolving. Information in this SONET …
简化设计验证的最佳伴侣
本读物面向的是由于时间限制和成本限制等现实条件,而希望学习怎样简化当前数字系统的调试和验证工作的专业技术人员。本读物重点介绍 ,在验证设计时帮助您提高生产效率,在调试出现的问题时提高您的效率。为演示这些概念,我们将从该概念到成品,介绍基于微处理器的新型嵌入式系统的发展。
Overcoming a wide array of UWB test challenges: Part 2
Using Tektronix AWG7000 Series in Synchronous Applications
Synchronous test systems are becoming more important in many applications and being able reduce any uncertainty of when a trigger is sent, to when the signals are outputted is challenging for any …
RapidIO Architecture: Building the Next-Generation Networking Infrastructure
RapidIO®, a high-performance, packet-switched bus technology, delivers the bandwidth, software independence, fault tolerance and low latency needed for the design of next-generation networking …
Solving the Complexity of DigRF Testing
No matter what stage of the development you are involved in, when it comes to RF test equipment, flexibility is the key. Test equipment needs to be flexible enough to go beyond just verifying that the …
Smiths Detection Relies on Tektronix to Take the Trouble out of Troubleshooting
A team of engineers at Smith Detection needed to quickly, efficiently and accurately identify and resolve problems during the development of complex handheld devices. Learn how Smith Detection …
Complex UWB Signal Generation using Advanced Waveform Editing Tools
New RF transmission systems, like UBW-WiMedia, are proliferating. This is causing engineers to look for better ways to simulate intricate RF signal behaviors and interactions. At the same time, a push …
Overcoming a wide array of UWB test challenges: Part 1
Eye Measurements on Optical RZ Signals
This technical brief describes several automatic eye measurements for RZ signals contained in Tektronix' DSA8200 sampling oscilloscope. Examples of real signals are presented, as well as guidelines …
Fluke/Tektronix Solutions Brochure
Fluke and Tektronix solutions for electronic design, manufacturing and service professionalsProfessionals designing the next award-winning electronic products or manufacturing 100% defect-free …
PCI Express Power State Management Validation and Debug Using the Tektronix Logic Protocol Analyzer
These solutions deliver the performance to capture, display, and analyze the most complex serial signals.
SuperSpeed USB/PCIe Gen 3一致性测试和验证(英)
Gain an updated understanding of open standards compliance test approaches and upcoming test specification releases in this informative session. See how Tektronix supports required Transmitter …
Correlation of 10GBASE-T Linearity Measurements on the Oscilloscope and Spectrum Analyzer
Read about the purity results of the DAC (used at the output) in a recent measurement conducted on transmitter linearity via Spurious Free Dynamic Range
TriMode™ 三模探头构架
串行数据标准,如PCI Express ,SATA 和HDMI 需要在测量差模和单端参数的同时,也测量共模参数。这些测量通常会耗费很多时间,因为需要重复细致地连接、再连接多个差分探头,然后再把这些探头移动到下一个测试点,以完成必须的测量任务。使用TriModeTM 三模构架的P7500 系列探头系统迈出了探测方式的革命性步伐:它们是市场上唯一的解决方案,让用户不再需要使用多条探头 …
Overcoming PCI-Express Physical Layer Challenges
This paper will present how the Tektronix Logic Protocol Analyzer is used to overcome these challenges using powerful triggering and multiple data views.
泰克接收机测试解决方案
接收机测试给需要执行测试和检定新兴设备的设计人员带来了一个最大挑战。根本问题是"接收机在实际环境条件下是否会正确工作?"及"最坏情况下的行为是什么?"
SDH Telecommunications Standard Primer
SDH (Synchronous Digital Hierarchy) is a standard for telecommunications transport formulated by the International Telecommunication Union (ITU), previously called the International Telegraph and …
SDH Telecommunications Standard Primer
SDH (Synchronous Digital Hierarchy) is a standard for telecommunications transport formulated by the International Telecommunication Union (ITU), previously called the International Telegraph and …
Hunting PCIE Flow Control Bugs
This white paper describes in detail the use of the Bird's Eye View (BEV), a completely new visualization, to investigate flow control. Not only does the BEV provide a full-acquisition view of the …
UWB WiMedia 一致性测试解决方案
全面支持WiMedia 物理层测试规范1.0 版和1.2 版UWB WiMedia 测试要求是当前宽带RF标准中最复杂的测试要求。设计人员必需检验大量的物理层参数之后,才能确定能否冻结设计。满足这些要求的强大灵活的测试解决方案改善了UWB 设计的产品开发周期。 
USB3.0 一致性测试解决方案
USB (通用串行总线)可以使用通用接口插座,把便携式磁盘驱动器、打印机和数码相机等外设连接到电脑上。USB 3.0 把数据速率从480Mb/s 提高到5 Gb/s,并增加了全双工传送功能。USB 标准由USB 实现者论坛维护,其官方网址为:www.usb.org。
泰克PCI Express 解决方案
为事务层、链路层和物理层测试提供的最强大、最完整的测试方案PCI Express 是为各种计算平台和通信平台设计的高性能通用I/O 互连。PCIExpress 1.1 支持2.5GT/s 的单路数据速率,2.0 采用8b/10b 编码,把该速率提高一倍,达到5GT/s。PCI Express 3.0提供了8GT/s 链路,使用数据加扰,把2.0 的数据速率又提高了一倍。
泰克USB 测试解决方案
电接口验证和一致性测试、信号路径检定、数字验证和调试、无线EVM 一致性测试
以太网测试解决方案
完整的10BaseT、100BaseT、1000BaseT 物理层测试解决方案
泰克UWB WiMedia 测试挑战
UWB WiMedia 测试挑战支持物理层测试:认证无线USB、下一代蓝牙和其它WiMedia 实现方案泰克为超宽带技术提供了完善的一系列工具,可以直接生成高达5.8GHz 的信号,合成所有频段组和时频代码,为接收机余量测试创建实际环境损伤,使用UWB- WiMedia 自动测量全面分析信号,导出信号进行调试和后期处理,使您能够迅速高效地解决设计挑战。UWB WiMedia …
串行通信测试解决方案应用速查资料
支持发射机、接收机和互连测试串行数据总线为通过行业公认的接口连接计算机和嵌入式设备提供了所需的组网、互连和通信功能。泰克为各种标准提供了强大完善的一系列测试仪器,包括 USB、PCI Express、以太网、CAN/LIN/FlexRay、I2C、I2S、MIPI、等等。
高度可靠地测试10-Gb/s 系统(STM-64/OC-192)
高度可靠地测试10-Gb/s 系统由于80C02 和80C04取样模块独特的体系结构,CSA8000 的转换增益和信噪比(SNR)改善了近两倍。这些模块还在 理想的ITU 光参考接收器(ORR)响应中实现了更加紧密的 容限。其结果,改善了测量结果的重复性,在创建10-Gb/ s发射器和网络时,在测量质量上为设计人员提供了更高 的信心。互联网、电子商务、虚拟专用网、IP电话和其它以数据为 …
怎样最大限度地利用泰克高性能示波器
不管是设计拥有多条高速链路和接收机的串行数据通信系统,还是设计DDR存储器接口,或是设计数字视频系统,您都必需树立信心,确认正确完成自己的任务。实现这一点的唯一途径是查看部分关键信号及其相对时间关系, 另外要确认这些信号是干净的, 没有携带串扰干扰或任何其它类型的不理想特点。您还希望相当简单明了地完成波形查看、验证或调试任务,而不会影响工作,以满足约定的时间表。示波器为树立这种信心提供了最佳伴侣 …
逻辑分析仪触发技术,捕获难检问题
对需要验证和调试产品设计的数字设计人员来说,逻辑分析仪提供了突破性的触发功能,可以捕获实时数字系统操作。本应用指南阐述了怎样使用逻辑分析仪触发技术,通过捕获难检问题,检验设计实现方案,满足您的设计时间表,改善设计质量。其为快速处理难检问题提供了高效的解决方案。
10GBASE-T 的物理层一致性测试
10GBASE-T 以太网为设计和测试带来了新的挑战。在本应用指南中了解可为 10GBASE-T 设计验证提供适当和最佳电子测试的工具。
使用集成逻辑分析仪与示波器快速调试信号完整性
Fast product development requires fast and efficient troubleshooting of signal integrity problems. Signal integrity is a growing priority as digital system designers pursue ever-higher clock and data …
简化CAN和LIN车载网络测试
本应用指南介绍了CAN和LIN协议的举出知识。它介绍了DPO7000系列和LSA选项把集成式CAN特定触发功能与TDSVNM CAN和LIN定时和协议解码软件结合在一起,满足了在调试和测试车在网络是没有得到满足的需求。
简化USB 设计的调试和验证
通用串行总线已经成为了连接个人电脑和外部设备的事实上的工业标准。USB2.0 最初是在2000 年左右进入市场,提供了比USB1.1 快40 倍数传速度。USB2.0 彻底开启了大数据量高速传输应用的大门。USB1.0 低速(1.5Mbps) 和USB1.1全速 (12Mbps) 满足对于像键盘、鼠标这类的外设的连接;高速USB2.0 (480Mbps) 主要支持多媒体 …
Creating Calibrated UWB WiMedia Signals
To maintain the integrity of signals over the whole band, pre-distorting the waveform becomes necessary, therefore the need to calibrate the whole system. This application note details the steps …
Cross-bus Analysis Reveals Interactions and Speeds Troubleshooting
Cross-bus analysis has become an indispensable troubleshooting methodology. This application note discusses how the powerful new logic analysis solution from Tektronix can speed your cross-bus …
Analyzing 8b/10b Encoded Signals with a Real-time Oscilloscope
This application note discusses troubleshooting and verifying devices with 8b/10b serial buses using the Tektronix MSO/DPO/DSA70000 Series oscilloscopes with their powerful real time triggering of …
Automatic Measurement Algorithms and Methods for High-Performance Communications Applications
This application note contains detailed information on CSA/TDS8000 Series algorithms and describes their use to generate and perform automatic measurements, emphasizing the analysis of multivalued …
TekExpress Software and MIPI® Physical Layer and Protocol Layer Testing
Understanding and performing MIPI® D-PHY physical layer, CSI and DSI protocol layer testing with Tektronix TekExpress software and oscilloscopes.
TCP/IPv4 and Ethernet 10BASE-T/100BASE-TX Debugging with the MSO/DPO4000B Series Oscilloscopes
This application note covers the overall view of the Internet Protocol Suite and the operation of each layer and concludes with working with Ethernet 10BASE-T and 100BASE-TX signals with the …
Finding and Examining Pattern-dependent Failures with FrameScan™ Acquisition Technology
As bit rates increase to 10 Gbps and beyond, pattern-dependent failures become much more common in the generation, transmission, and reception of signals in various data and communication products …
使用AWG和直接合成技术迎接高速串行数据接收机测试挑战应用指南
数字数据当今正盛行于各种各样的消费品中,在设计和测试这些流行器件时,高速串行数据测试是工程师面临的最大的挑战之一。制造商和设计人员必须测试产品和设计,以保证最终产品能够处理真实世界条件。本应用指南重点介绍了DisplayPort,但其中涉及的技术则适用于PCI Express、SATA、HDMI及许多其它规范。
简化USB 设计的调试和验证
通用串行总线已经成为了连接个人电脑和外部设备的事实上的工业标准。USB2.0 最初是在2000 年左右进入市场,提供了比USB1.1 快40 倍数传速度。USB2.0 彻底开启了大数据量高速传输应用的大门。USB1.0 低速(1.5Mbps) 和USB1.1全速 (12Mbps) 满足对于像键盘、鼠标这类的外设的连接;高速USB2.0 (480Mbps) 主要支持多媒体 …
开发经济型通信的嵌入式设计技术
随着嵌入式设计的智能程度和可连接性不断提高,这些设备的通信链路变得越来越重要。同时,迫于最终用户对便携能力、延长电池工作时间及降低价格等有关的需求,日益要求找到一种经济的可靠通信的手段。有线接口在许多嵌入式应用中非常常见,如USB 和以太网,在许多应用中正被推向标准的极限,而人们对电池供电的便携式设备情有独钟,则推动着对更加节能的无线连接的需求。本应用指南介绍了三种采用特定测量技术的有形应用 …
开发经济型通信的嵌入式设计技术
随着嵌入式设计的智能程度和可连接性不断提高,这些设备的通信链路变得越来越重要。同时,迫于最终用户对便携能力、延长电池工作时间及降低价格等有关的需求,日益要求找到一种经济的可靠通信的手段。 有线接口在许多嵌入式应用中非常常见,如USB 和以太网,在许多应用中正被推向标准的极限,而人们对电池供电的便携式设备情有独钟,则推动着对更加节能的无线连接的需求。本应用指南介绍了三种采用特定测量技术的有形应用 …
硬盘设计测量解决方案
This application note illustrates a number of measurement techniques relevant to six general areas of disk drive design. It provides a summary of modern instrumentation and techniques available for …
Title
Solutions to Embedded System Design Challenges Webinar
In this tutorial we will examine ways to improve productivity in embedded system validation and debug. Part I focuses on what can be done in the early design cycle to improve productivity. Part II …
High Speed Serial Data Receiver Testing Webinar
This webinar discusses the challenges in generating signals with increasing speeds for the latest serial standards and for thoroughly testing any receiver with "real world" or "worst case" conditions …
Ultra-Wideband Technology and Test Solutions Including WiMedia Webinar
WiMedia UWB is a rapidly growing technology that promises to revolutionize low power, short range wireless applications. It has quickly emerged as a leading technology for applications such as …
Jitter Fundamentals
View this recorded webinar to get a solid overview of jitter components as well as jitter characterization and visualization. Learn how to control Jitter during system design and improve timing …
Title
PCI Express 3.0 De-embedding Method of Implementation Version 1.0
This document will provide a step-by-step procedure for extracting the Sparameters from the test channel of the PCI Express Gen 3 so it can be used for the purpose of removing the effects from the …
PCI Express 3.0 Receiver Test MOI for CEM Spec
This document covers the Method of Implementation (MOI) for PCI Express 3.0 CEM receiver testing, using BERTScope instruments. The document includes a step-by-step description of required hardware …
Methods of Implementation (MOI) for Verification+ Debug and Characterization
This document covers the Method of Implementation (MOI) for DPOJet measurements provided in the DPO70000 Option PCE, Option PCE3, and Option PCE4 solutions packages.
MIPI D-PHY Test Method of Implementation (MOI)
Overview:This selection of tests verifies various Electrical Characteristic requirements of D-PHY* products defined Section 8 of the D-PHY* Specification, version 0.9. Group 1 (8.1.x) verifies the …
MIPI® M-PHY Methods of Implementation
This document contains he MIPI® M-PHY* Measurements & Setup Library Methods of Implementation (MOI) for Verification, Debug, Characterization, Conformance and Interoperability Test
10BASE-T 实施方法 (MOI)
泰克的测试实施方法 本泰克测量文档指南按“原样”提供,且不提供任何形式的任何担保,包括但不限于任何非侵权性、适销性或针对特定用途的适用性的明示或暗示担保。在任何情况下,泰克、IEEE 或任何 IEEE 成员均不对任何直接、间接、特殊、惩戒性、惩罚性或结果性损害承担责任,包括但不限于利润损失,即使被告知可能发生此类损害亦是如此。 本资料仅供参考。
1000BASE-T 实施方法
泰克的测试实施方法 本泰克测量文档指南按“原样”提供,且不提供任何形式的任何担保,包括但不限于任何非侵权性、适销性或针对特定用途的适用性的明示或暗示担保。在任何情况下,泰克、IEEE 或任何 IEEE 成员均不对任何直接、间接、特殊、惩戒性、惩罚性或结果性损害承担责任,包括但不限于利润损失,即使被告知可能发生此类损害亦是如此。 本资料仅供参考。
100BASE-TX 实施方法 (MOI)
泰克的测试实施方法 本泰克测量文档指南按“原样”提供,且不提供任何形式的任何担保,包括但不限于任何非侵权性、适销性或针对特定用途的适用性的明示或暗示担保。在任何情况下,泰克、IEEE 或任何 IEEE 成员均不对任何直接、间接、特殊、惩戒性、惩罚性或结果性损害承担责任,包括但不限于利润损失,即使被告知可能发生此类损害亦是如此。 本资料仅供参考。