What are C-V measurements?
C-V refers to Capacitance vs. Voltage. C-V measurements are an integral part of semiconductor device characterization. C-V measurements are used to see how the capacitance of a semiconductor device varies with voltage. C-V is commonly used to determine semiconductor parameters such as doping profiles, density of interface states, threshold voltages, oxide charge, and carrier lifetime. Keithley s Model 590 and 595 are designed for C-V measurements.
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