半导体设计和制造

新的半导体材料如 SiC 和 GaN,在开发期间常常引入特别的挑战。

  • 直流半导体检定需要全面的 I-V、C-V 和快速脉冲式测量。
  • 测试高功率半导体器件时需要更高的电压和功率水平、更快的切换时间、更高的峰电流和更低的漏电流。
  • 半导体生产环境需要自动化、探测站集成、速度和吞吐量进行芯片分选、晶片验收和可靠性测试。

高速数字接口需要更短的 PHY 验证周期。更快地调试、协议解码和识别源信号中的串扰等抖动和噪声,是设计师的最大需求。

电子验证测试太多,时间太少?泰克帮助您解决这一挑战!泰克最新推出4200A-SCS参数分析仪,将I-V和C-V测量速度提升两倍!了解详情

码型数据库

There’s much more to choosing a DMM than just its number of digits. With…

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Current/Voltage Made Accurate and Simple

In our webinar we look at ten common applications, from LEDs and Laser Diodes to measuring power efficiency of power management ICs and solar cells. 

Current/Voltage Made Accurate and Simple

In our webinar we look at ten common applications, from LEDs and Laser Diodes to measuring power efficiency of power management ICs and solar cells. 

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