This application note provides practical steps for applying these techniques using SIM. Written for engineers who already understand eye diagrams, jitter, and noise analysis, it focuses on measurement compensation and signal-path transformation. Each of the four examples that follow addresses a specific measurement challenge — reference-plane ambiguity, early channel exploration, receiver equalization, and DDR reflection removal — and walks through the SIM workflow that resolves it. An Appendix provides S-parameter fundamentals for readers who want a deeper background on the underlying theory.
This application note:
- Gives a brief overview of the test challenges in high-speed systems.
- Covers compensation methods that shift the reference plane virtually and enable quick “what-if” exploration directly on an oscilloscope.
- Demonstrates four practical examples: recovering signal integrity with de-embedding, predicting system performance with embedding, optimizing receiver performance with CTLE equalization, and removing DDR reflections using mid-bus probing.
- Includes an Appendix with an explanation of S-parameter fundamentals in relation to system modeling, de-embedding, embedding, and Tx and Rx equalization including CTLE, FFE, and DFE.
Tektronix oscilloscopes, with the optional Signal Integrity Modeling software (opt. SIM and SIMA) and Advanced Jitter Analysis (opt. DJA) software, provide an on-oscilloscope solution for detailed signal analysis, design validation, and high-speed digital compliance testing. Tektronix 5 and 6 Series B MSO and 7 Series DPO oscilloscopes support SIM/SIMA and DJA software. For more information on these and other Tektronix oscilloscopes download the Oscilloscope Selection Guide.