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产品技术资料 文献编号： 发布日期 4200A-SCS参数分析仪技术资料
亲眼见证创新！4200A-SCS是一种可以量身定制、全面集成 的参数分析仪，可以同步查看电流电压 (I-V)、电容电压 (C-V) 和超快速脉冲式I-V特性。作为性能最高的参数分析仪， 4200A-SCS 加快了半导体、材料和工艺开发速度1KC-60780-7
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技术文档 文档类型 发布日期 使用吉时利Model 4200-SCS参数分析仪进行晶圆级可靠性测试
应用指南 为新一代电力电子设计改进材料和测试
Transitioning from silicon to wide bandgap semiconductors such as silicon carbide and gallium nitride means that power module designs can be physically smaller than what came before, while also increasing MOSFET switching speed and energy efficiency …技术简介 使用4200A-SCS参数分析仪测量碳纳米管晶体管(CNT FETs)的电气特点 - NEW
应用指南 使用4200A-SCS参数分析仪在高阻抗器件上执行超低频率电压-电压测量 - NEW
应用指南 使用4200-CVU-PWR C-V功率分析软件包及4200A-SCS参数分析仪执行高电压和高电流C-V测量 - NEW
应用指南 使用Model 4225-RPM远程放大器/开关，在DC I-V、C-V和脉冲式I-V测量之间自动切换 - NEW
应用指南 吉时利为电化学测试方法和应用提供的仪器
应用指南 Touch, Test, Invent，采用下一代电流和电压源测量仪器
速查资料 为您的4200-SCS参数分析仪注入新生
速查资料 从Windows XP转向Windows 7升级您的Model 4200-SCS
操作方式指南 按信号类型进行切换的电子手册指南
速查资料 测量通道有效移动性的超快速单脉冲技术
应用指南 纳米技术电气测量最新技术电子手册
Rev 3.13速查资料 如何选择和应用源/测量仪器（源表）
应用指南 使用4200A-SCS参数分析仪分析光伏材料和太阳能电池的电气特点 - NEW
应用指南 Controlling the 4200A-SCS Parameter Analyzer Using KXCI and Python 3
Introduction The Keithley External Control Interface (KXCI) allows remote control of the instrument modules contained within the Keithley 4200A-SCS Parameter Analyzer by sending external commands from a PC. Each KXCI command has a specific function …应用指南 Keithley Connectors Adapters and Tools Selector Guide
Model Name Use With: 237-BAN-3A Triax to Banana Plug 4200A-SCS, 7072,7072-HV, DMMs 237-BNC-TRX 3 …产品选择器指南 Supporting the Materials Research of the Future
Advances in materials science are driving the future of many industries where the electrical properties of materials can reveal previously unknown materials characteristics. This flyer highlights the Keithley instrumentation that is vital to helping …速查资料 Four Step Error Checker Poster
This printable poster offers insight into errors commonly made when measuring low voltage, low current, low resistance, high resistance, or voltage from a high resistance source. Learn what can cause these errors, and get tips on how to avoid them.海报 Keithley Low Level Measurements Handbook - 7th Edition
The Keithley Low Level Measurements Handbook is a reference and guide for anyone looking to perform sensitive DC electrical measurements. Scroll down to find the section you need, or download the entire book as a PDF above. Once you click on each of …产品文章 Making Optimal Capacitance and AC Impedance Measurements with the 4200A-SCS Parameter Analyzer
Introduction Capacitance-voltage (C-V) and AC impedance measurements are commonly performed on many types of devices for a wide variety of applications. For example, C-V measurements are used to determine these device …应用指南 Making Low Current Pulse I-V Measurements
This application note defines ultra-fast I-V, explains the fundamental limits of current measurements as a function of time and measure window, and describes the techniques for making ultra-fast I-V low current measurements.应用指南 1 ns Pulsing Solutions for Non-Volatile Memory Testing
Until recently, floating gate (FG) NAND flash memory technology has been successful in meeting the demand for non-volatile memory (NVM) devices for tablets and smartphones. However, there is increasing concern in the …技术简介 Upgrade Your 4200-SCS System and Protect Your Investment
Upgrade your 4200-SCS Parameter Analyzer to the 4200A-SCS - the industry's highest performance analyzer - and accelerate I-V, C-V, and ultra-fast pulsed I-V testing of your complex devices for materials research, semiconductor device design, process …速查资料 SOLUTIONS FOR SCIENTIFIC AND ENGINEERING RESEARCH
手册 Pulse Testing for Nanoscale Devices
技术文章 The Emerging Challenges of Nanotechnology Testing
Nanotechnology is an important new area of research that promises significant advances in electronics, materials, biotechnology, alternative energy sources, and dozens of other applications. …技术文章 Qualifying High-K Gate Materials with Charge-Trapping Measurements
As the size of transistors continues to scale down, the use of conventional SiO2 as a gate dielectric material is approaching physical and electrical limits. The principal limitation is high leakage current due to quantum mechanical tunneling of …技术文章 Measuring MOSFET Gate Charge with the 4200A-SCS Parameter Analyzer
Introduction Power MOSFETs are used in a variety of applications and can be used as high-speed switching. The switching speed of the device is affected by internal capacitances, which is typically specified in data sheets in terms of Ciss and Coss …应用指南
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软件 文档类型 部件号： 发布日期 4200A-SCS Clarius+ Software Suite V1.12
This version of Clarius+ is only supported on Microsoft Windows 10. If installed on the 4200A-SCS system with a Clarius+ release prior to V1.4, contact Keithley, a Tektronix company, at tek.com to upgrade the parameter analyzer If installing on a …应用 4200A-CLARIUS-V1.12 4200A-SCS Clarius+ Software V1.11
This version of Clarius+ is only supported on Microsoft Windows 10. If installed on the 4200A-SCS system with a Clarius+ release prior to V1.4, contact Keithley, a Tektronix company, at tek.com to upgrade the parameter analyzer. If installing on a …应用 4200A-CLARIUS-V1.11 4200A-SCS Clarius+ Software Suite V1.9
This version of Clarius+ is only supported on Microsoft Windows 10. If installed on the 4200A-SCS system with a Clarius+ release prior to V1.4, contact Keithley, a Tektronix Company, at TEK.com to upgrade the parameter analyzer. If installing on a …应用 4200A-CLARIUS-V1.9 Matlab_Hello world使用Matlab对仪器设备进行编程入门
本例程提供了Matlab对仪器进行控制，演示了最基本的连接仪器的步骤。 请注意相关软件配置环境以及VISA resource地址。Tektronix公司不负责该例程的完整性、可执行性和正确性。 请点击‘’安装说明“链接直接获取 TXT 源码文件编码采样 4200A-SCS Clarius+ Software Suite V1.3 (Legacy – Unsupported)
This legacy version of Clarius is made available for Windows 7 computers. For the latest version of Clarius+ please visit the 4200A-SCS Product Support page ( Product Support and Downloads | Tektronix ) and select Software. The 4200A-SCS Clarius+ …应用 4200A-CLARIUS-V1.3
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常见问题 常见问题 ID Is there a resettable fuse on the interlock circuit for model 4200A-SCS?
Yes, there is a resettable fuse. It takes several minutes to reset, please give it some time.This is discussed on page 4 and 5 of the included application note. Here is a link to the application note on the Tek website: https://www.tek …248681 What is the time required to switch between Pulse IV (4225PMU) and CV (4210ACVU) measurements using the 4225-RPM for the 4200A-SCS?
The RPM eliminates the need to re-cable and increases switching speed between Pulsed IV and CV measurements. However, we do not specify the switching time for the RPMs in the data sheets. A simple test using a MDO3102 yeided the below …469646 How can I measure hall mobility of 2D materials?
Hall mobility, or electron mobility, of a 2D material is best measured by utilizing the Hall effect. There are several different Keithley solutions for making Hall effect measurements. A Keithley 4200A-SCS Parameter Analyzer with 4 Source Measure …71221 I have lost the device library on the 4200A-SCS, how to get it back?
The best way to get the library back is to re-install Clarius the their system. It’s free from our Tek.com website. Here is the link :https://www.tek.com/software/clarius/1-3247546
