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3D Sensing Series

Topic Abstract Learn More

Overcoming the Measurement Challenges of Diode and Opto Component Testing

4200A
Diode-based optical devices are at the heart of 3D sensing (e.g. facial recognition). During the webinar you’ll learn how to:
  • Use synchronized pulse testing to detect and capture light power for high volume VCSEL and laser diode array production testing
  • Manage temperature and increase throughput
  • Achieve measurement integrity, throughput and efficiency
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