Given the explosive growth of the communications industry, a tremendous amount of testing is being performed on the various components that make up different communications systems. These components range from active components such as Radio Frequency Integrated Circuits (RFICs) and Microwave Mono-lithic Integrated Circuits (MMICs) to space communication systems. While the testing requirements and procedures for these components differ widely, all are tested at very high frequencies, typically at gigahertz or higher. The main components in a typical test system may include DC bias, DC measurement, RF power meter, network analyzer, etc. Automating the test process and improving test efficiency demands integrating RF/microwave and low frequency switching systems into thetest system.
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