This EE World article – Automate Double-Pulse Testing in WBG Devices – explores how automating double-pulse testing for wide bandgap devices like SiC and GaN power devices results in significant reductions in setup and analysis time.
While the types of electrical tests required during the design and production of power conversion equipment are similar to those required for previous generations of devices, the adoption of wide-bandgap materials like silicon carbide (SiC) or gallium nitride (GaN) requires added rigor and new test strategies.
Bench testing continues to play an important role at every stage of the development of …
