联系我们
与泰克代表实时聊天。 工作时间：上午 9:00 - 下午 5:00（太平洋标准时间）。
电话
致电我们
工作时间：上午9:00-下午5:00（太平洋标准时间）
下载
下载手册、产品技术资料、软件等：
反馈
产品支持和下载
欢迎访问泰克产品支持
虽然我们很愿意与您全天“讨论技术问题”，但我们知道您时间宝贵。因此，我们简化了流程，让您可以轻松下载所有当前产品以及许多停产产品的手册、产品技术资料和软件。只需告诉我们您使用的是哪种产品，我们就会向您显示所有相关信息。
您选择的产品型号当前有售。 提供了以下支持信息。
-
产品技术资料 文献编号： 发布日期 $name
KickStart 仪器控制软件
KickStart软件让你加快获得测量数据。 KickStart简化了您需要知道的仪器知 识，在短短几分钟内，您就可以开箱使 用仪器，获得被测器件的实际数据。通 过立即绘制数据图，在读表中快速提供 数据的统计汇总，KickStart可以让您 更快地收集所需信息，制订所需决策， 转向器件开发的下一个阶段。通过使用 方便的导出功能，KickStart可以简便 迅速地复现测试，比较结果，节省时间。 有了KickStart，您可以把重点放在理 解测试结果上，让您的团队满足创新目 标。1KW-60965-3 2600B数字源表产品技术资料
2606B System SourceMeter® SMU Instrument
Datasheet for Keithley's 2606B System SourceMeter Source Measure Unit (SMU) Instrument, which offers four 20-watt SMU channels in a 1U high form factor chassis.1KW-61394-0 TSP Toolkit Visual Studio Code Extension
The Keithley TSP Toolkit is a Visual Studio Code extension that provides rich support for Keithley’s TSP technology to edit and execute scripts. The datasheet provides information about its features and functionality.1KW-74115-0 Model 4299-1 Single-Unit Rack-Mount Kit Installation Instructions
The Model 4299-1 Single-Unit Rack-Mount Kit contains the hardware required to mount one half-rack instrument in a standard 48.3 cm (19 in.) rack. Typical installation is for one Series 2600A or 2600B System SourceMeter® instrument.PA-908F Model 2600B-PM-1 200 V Protection Module with 1 A Clamp
The Model 2600B-PM-1 200 V Protection Module with 1 A Clamp is a stand-alone module that protects Model 2635B and 2636B source-measure units (SMUs) that are part of a testing configuration from damage by voltage sources that are greater than 220 V.071322002
-
手册 手册类型 部件号： 发布日期 TSP Toolkit Quick Start Guide
用户 077187800 Model 2600B Series SMU Firmware Version 4.0.0
维修 077180300 Series 2600B System SourceMeter Instrument User's Manual
主要用户 2600BS-900-01A Series 2600B System SourceMeter Instrument Reference Manual
主要用户 2600BS-901-01F Model 4299-2 Dual-Unit Rack-Mount Kit Installation Instructions
The Model 4299-2 Dual-Unit Rack-Mount Kit contains the hardware required to mount two half-rack instruments in a standard 48.3 cm (19 in.) rack. Typical installation is for two Series 2600A or 2600B System SourceMeter® instruments or one Series 2600A …用户 PA-909J Keithley Instruments Software and Documentation Downloads
Document that provides descriptions of some of the software, drivers, and documentation that is available on the website.用户 071352702 Model 2601B-PULSE-CA1 50 Ohm BNC-to-BNC Cable Kit Instructions
用户 077168800 Models 2611B, 2612B, and 2614B System SourceMeter Instruments Quick Start Guide
主要用户 2612B-903-01D Models 2634B, 2635B, and 2636B System SourceMeter Instruments Quick Start Guide
主要用户 2636B-903-01D Models 2601B, 2602B, and 2604B System SourceMeter Instruments Quick Start Guide
主要用户 2602B-903-01D Model 2600-FIX-TRX Grounded Phoenix-to-Triax Cable Adapter
Model 2600-FIX-TRX Grounded Phoenix-to-Triax Cable Adapter instructions Instructions用户 PA-1004C Keithley Instruments Safety Precautions
Safety Precautions PA用户 071341102 Model 174710700 Shielded LAN Crossover Cable
The Model 174710700 is a shielded twisted-pair Category 5e LAN crossover cable that allows triggering and communications between ethernet-enabled instruments and TSP-Link enabled instruments.用户 077143400 Model CA-558 3-Pin Interlock Connector Cable
Model CA-558 3-Pin Interlock Connector Cable User Manual用户 PA-1044B Series 2600 System SourceMeter User's Manual
User Manual用户 2600S-900-01C Series 2600A System SourceMeter User's Manual
User Manual用户 2600AS-900-01B Parametric Curve Tracer Open Me First Instructions
Open Me First Accessory Kit Guide User Manual071327200 Model 7709-308 25-Pin D-Sub Connector Instructions
主要用户 PA-1082B Model 2600B-PM-1 200 V Protection Module with 1 A Clamp
Model 2600B-PM-1 Protection Module Instructions Rev B User Manual071322002
-
技术文档 文档类型 发布日期 用于 3D 感测的激光二极管阵列测试
本应用指南介绍如何轻松将台式仪器整合到整体系统，并在任何自动化环境或生产环境中实现优秀的触发同步和 最大吞吐量。应用指南 增强用于 VCSEL 的大批量生产测试的触发同步
本应用说明介绍在 Keithley 2600B 系列 SMU 仪器上实现高度同步的触发系统的几种有效测试方法。应用指南 电源测量小贴士
在本指南中，我们将采取简单的工作流程，提供10个设计阶段中每个阶段的测试小贴士。希望本指南对您有所裨益，让您的测试更高效。在本指南中，我们将采取简单的工作流程，提供10个设计阶段中每个阶段的测试小贴士。希望本指南对您有所裨益，让您的测试更高效。立即下载宣传册 将2600B与移动设备连接
Two diagrams show you how to easily connect your 2600B Series Source Measure Unit (SMU) Instrument to an Android or iOS mobile device. Download the PDF to read more:操作指南 四个关键测试：电源设计中验证MOSFET性能
If you need to evaluate MOSFET devices, download our poster to learn the test specification and technique, test configuration and the typical results for the four key MOSFET tests.Download the poster to learn about these four key tests:Drain Family …海报 高效完整的半导体功率器件特性分析，校对，稳定测试技术
速查资料 Touch, Test, Invent，采用下一代电流和电压源测量仪器
速查资料 测试一个新的开关模块的电源设计海报
Get a quick overview of the key measurements for verifying a new switch mode power supply (SMPS) design. This poster shows key measurements, from verifying your prototype during initial startup, to optimizing switching loss and magnetic losses, to …海报 用2600B的信号源功能与2650A系列数字源表执行FORD EMC 功率循环测试
学习如何利用数字源表的高电流信号源功能进行功率循环测试。这篇应用文章描述了利用2600B的信号源功能与2650A系列数字源表执行FORD EMC-CS-2009.1 CI 230功率循环测试的详细程序。应用指南 功率转换效率测试的有效工具与技巧
速查资料 当今汽车电子的电源测试应用手册
宣传册 当今汽车电子的电源测试
宣传册 Optimizing Reliability Testing of Power Semiconductor (Chinese version)
应用指南 使用吉时利 SMU 仪器和开关系统优化功率半导体器件和模块的可靠性测试
应用指南 Applications Guide - Techniques for Multi-Channel Testing and Data Acquisition
速查资料 汽车通讯与控制系统的测试方法
速查资料 半导体测量中的高速与输出
海报 按信号类型进行切换的电子手册指南
速查资料 学会克服高亮度 LED 的电气测量挑战
应用指南 高功率半导体器件的VDS Ramp与HTRB稳定性测试
应用指南 纳米技术电气测量最新技术电子手册
Rev 3.13速查资料 利用2600B源表系统简化FET测试
应用指南 如何选择和应用源/测量仪器（源表）
应用指南 如何选择和应用源/测量仪器（源表）
应用指南 如何选择和应用源/测量仪器（源表）
应用指南 利用吉时利高功率系统数字源表 ® 源测量单元（SMU）仪器对功率 半导体器件进行测试
产品文章 用 2600B 系列源表 SMU 和 MSO/DPO-5000 或 DPO-7000 系列示波器简化 DC-DC 转换器 特性分析
应用指南 如何用2602B系列数字源表进行激光二极管模块和VCSELs的高吞吐量DC生产测试
应用指南 利用大功率数字源表构建多源测量单元（SMU）系统
应用指南 寻找当今解决方案，迎接未来纳米特性分析挑战
宣传册 #2647 IDDQ Testing and Standby Current Testing with Series 2600 System SourceMeter Instruments (also Applicable to Series 2600B)
job #2647应用指南 Using Keithley’s All-In-One Battery Test Solution to Characterize, Optimize, and Exercise IoT Home Security Products
Introduction With the increasing prevalence of wireless technology and IoT devices, the need for rechargeable batteries that perform consistently over multiple charge cycles has grown exponentially. Consumers want to be certain that IoT controlled …应用指南 Pulsed I-V Characterization of MOSFETs Using Keithley KickStart Software
Introduction Manufacturers of transistor devices tend to start their design prototype evaluations to yield characteristic information, while still working in their research and design labs. While straight DC testing is …应用指南 DC I-V Characterization of MOSFET Devices Using KickStart Software
Learn or review the details of some of the most common types of device transfer and characterization tests applied to metal oxide semiconductor field effect transistors (MOSFETs). This application note also presents itself as a graphic guide for how …应用指南 The TSP Technology Umbrella
Learn about Test Script Processor (TSP) Technology and the TSP Command Set, TSP-Link, TSP Programming Language and TSP-Net. Test Script Processor (TSP) technology creates an edge computing solution for test and measurement instrumentation. …速查资料 Enhanced Instrument Automation with Test Script Processor Technology
This fact sheet discusses the TSP command set and programming language and the TSP Toolkit test script editor.速查资料 Harness the Power of TSP™ Toolkit Software
Introduction In an industry where rapid test development is crucial, the need for effective automation and easy code development has never been more pronounced. As businesses strive to enhance their quality while reducing time to market, the right …应用指南 Testing High Power Semiconductor Devices from Inception to Market
Introduction This primer examines the life cycle of a power semiconductor device and the tremendous variety of test and characterization activities and measurement challenges faced by the engineers involved in each stage throughout the cycle …入门指南 Threshold Voltage Testing Using JEDEC Standard JEP183A on SiC MOSFETs
Introduction Wide band gap devices are well known in power electronics technologies. Silicon Carbide (SiC) is a promising material which has advantages in gain efficiency and power density to achieve high voltage and high current in …应用指南 Models 2634B, 2635B, and 2636B System SourceMeter Instrument Specifications
SPECIFICATION CONDITIONS This document contains specifications and supplemental information for the Models 2634B, 2635B, and 2636B System SourceMeter™ instrument. Specifications are the standards against which the 2634B, 2635B, and 2636B are tested …技术指标 Boost Test Automation with On-Instrument Scripting - What is TSP?
Introduction Like many instrument operators, you may have a comfortable preference toward SCPI as the foundation for your instrument automation needs. If, however, you are looking for a means to reduce your test time and cost and are …应用指南 Model 2601B-PULSE System SourceMeter Instruments Specifications
This document contains specifications and supplemental information for the Model 2601B-PULSE System SourceMeter Instrument. Specifications are the standards against which the 2601B-PULSE is tested. Upon leaving the factory, the 2601B-PULSE meets …技术指标 2606B System SourceMeter Instrument Specifications
This document contains specifications and supplemental information for the 2606B System SourceMeter Instrument.技术指标 Timing Considerations for Constructing LIV Measurement Trigger Models Using the Keithley 2601B-PULSE System SourceMeter® Instrument and DMM7510 Graphical Sampling Digital Multimeter
This application note discusses how to synchronize two different instruments when making LIV measurements. The 2601B-PULSE is used as a pulsing source to the DUT, while a DMM7510 captures the resulting photodiode measurement.应用指南 Four Step Error Checker Poster
This printable poster offers insight into errors commonly made when measuring low voltage, low current, low resistance, high resistance, or voltage from a high resistance source. Learn what can cause these errors, and get tips on how to avoid them.海报 Source Measure Unit (SMU) Instruments Selector Guide
MAKE MULTIPLE MEASUREMENTS ACCURATELY USING A SINGLE INSTRUMENT A source measure unit (SMU) instrument is a five-in-one tool. It combines the useful features of a digital multimeter (DMM), power supply, current source, electronic load and pulse …产品选择指南 Models 2611B, 2612B, and 2614B System SourceMeter Instrument Specifications
This document contains specifications and supplemental information for the Models 2611B, 2612B, and 2614B System SourceMeter™ instruments.技术指标 How to Transition Code to TSP from SCPI
Introduction For many years, instrument manufacturers have used "Standard Commands for Programmable Instrumentation" (SCPI) to control programmable test and measurement devices in test systems. The goal of SCPI is to provide a uniform and …应用指南 How to Write Scripts for Test Script Processing (TSP)
Introduction This application note introduces scripting with Keithley's Test Script Processor (TSP) technology and its most powerful and enticing features. With scripting, programs and code can be loaded directly onto an instrument and run locally …应用指南 Keithley Low Level Measurements Handbook - 7th Edition
The Keithley Low Level Measurements Handbook is a reference and guide for anyone looking to perform sensitive DC electrical measurements. Scroll down to find the section you need, or download the entire book as a PDF above. Once you click on each of …产品文章 Simplifying DC-DC Converter Characterization with a Series 2600B System SourceMeter SMU Instrument and an MSO/DPO5000 or DPO7000 Series Scope
Introduction DC-DC converters are widely used electronic components that convert DC power from one voltage level to another while regulating the output voltage. The output provides a constant voltage to a circuit, regardless of …应用指南 Source Measure Units - Save Time, Space and Money and Make Multiple Measurements Accurately Using a Single Instrument
Make Multiple Measurements Accurately Using a Single Instrument All While Saving Space, Time and Money Do you use a power supply or digital multimeter? How about an electronic load, current source or pulse generator? Imagine if you could …宣传册 Measuring Laser Diode Optical Power with an Integrating Sphere
Introduction Characterizing radiant sources like laser diodes accurately depends on the ability to measure their optical power output accurately. A number of vital device characteristics can be extrapolated from these optical power measurements …白皮书 SOLUTIONS FOR SCIENTIFIC AND ENGINEERING RESEARCH
宣传册 7 Keys to Detecting Potential DUT Issues - Minimize Troubleshooting Time and Boost Productivity
海报 Model 2600B-PM-1 SMU Protection Module Characteristics
This document contains specifications and supplemental information for the Model 2600B-PM-1 Protection Module. Specifications are the standards against which the Model 2600B-PM-1 is tested.技术指标 LLCR Pin Socket Testing with the Model 3732 High Density Matrix Card
应用指南 Understanding Control Systems and Communications for Today's Automobiles
速查资料 Maximize Speed and Throughput for Semiconductor Measurements Using Source Measure Units (SMUs)
海报 E-Handbook to Understanding Electrical Test and Measurement
Introduction Welcome to Keithley's Guide to Understanding Electrical Test and Measurement. For over 60 years, Keithley testand measurement instruments have provided measurements ranging from the most basic to very complex. In all …速查资料 Your Guide to Creating High Performance Switching Applications
速查资料 New Materials and Devices E-Guide
宣传册 Choosing the Optimal Source Measurement Unit Instrument for Your Test and Measurement Application (also Applicable to Series 2600B)
白皮书 Optimizing Low-Current Measurements and Instruments
Characterizing devices at low current levels requires knowledge, skill, and the right test equipment. Even with all three, achieving accuracy at low current levels can be a challenge because the level of the current is often at or below the noise …白皮书 Advances in Electrical Measurements for Nanotechnology
Rev 3.15.13产品文章 Thermal Guidelines for Rack-Mounting Series 2600/2600A/2600B Instruments (also Applicable to Series 2600B)
应用指南 Methods to Achieve Higher Currents from I-V Measurement Equipment
应用指南 Creating Scaleable, Multipin, Multi-Function IC Test Systems Using the Model 2602 System SourceMeter Instrument (also Applicable to Series 2600B)
应用指南 Low Current Measurements
应用指南 Migrating Test Applications from the Keithley Model 2400 SourceMeter SMU Instrument to a Series 2600B System SourceMeter SMU Instrument
Introduction Keithley's Series 2600B System SourceMeter instruments are the test and measurement industry's fastest SMU (Source Measurement Unit) instruments. Based on Keithley’s thirdgeneration SMU architecture, the Series …应用指南 New Breed of Semiconductors Demands New Breed of Semi Characterization and Test Solutions
技术文章 Embedded Script Processors and Embedded Software Rank among the Most Significant T&M Instrument Design Trends of the Last Decade
技术文章 Demand for Higher Power Semi Devices Will Require Pushing Instrumentation to New Extremes
技术文章 Source Meters Selection Guide
产品选择指南 Source Measurement Unit (SMU) Instruments Simplify Characterizing a Linear Voltage Regulator's DC Performance
技术文章 Rapidly Expanding Array of Test Applications Continues to Drive Source Measurement Unit Instrument Technology (also Applicable to Series 2600B)
白皮书 Accurate, Cost-Effective High Brightness LED Testing Starts with Device Fundamentals
High brightness light emitting diodes (HBLEDs) combine high output and high efficiency with long lifetimes. Manufacturers are developing devices that offer higher luminous flux, longer lifetimes, greater chromaticity, and …技术文章 Testing High Brightness LEDs Accurately and Cost-Effectively in a Production Environment
技术文章 Discover the Industry Standard for LED Electrical Test
宣传册 Guide to Measuring New Materials and Devices
产品文章 #2639 High Speed Testing of High Brightness LEDs (also Applicable to Series 2600B)
应用指南 SMU-Per-Pin System Architecture Supports Fast, Cost-Effective Variation Characterization (also Applicable to Series 2600B)
白皮书 Evolving Semiconductor Characterization and Parametric Test Solutions from Keithley
Introduction The range of applications for semiconductor ICs and components has broadened dramatically and now plays a role in almost every aspect of our lives. Once, semiconductor manufacturers focused mainly on the component needs of …白皮书 Combining the Benefits of LXI and Scripting
技术文章 On-The-Fly Threshold Voltage Measurement for BTI Characterization
技术文章 New Test Sequencing Instruments Lower Cost of Test for Device Manufacturers (also Applicable to Series 2600B)
白皮书 #2889 Optimizing Switched Measurements with the Series 3700 System Switch/Multimeter and Series 2600 System SourceMeter Instruments Through the Use of TSP (also Applicable to Series 2600B)
应用指南 #2814 On-The-Fly Vth Measurement for Bias Temperature Instability Characterization (also Applicable to Series 2600B)
应用指南 Using Forward Voltage to Measure Semiconductor Junction Temperature
Semiconductor junctions, from the millions of transistors used in integrated circuits to the largearea compound junctions that make high brightness LED's possible, are all susceptible to early failure due to increased heat. This becomes …技术文章 #2633 Diode Production Testing with Series 2600 System SourceMeter Instruments (also Applicable to Series 2600B)
应用指南 #2616 Converting a Series 2400 SourceMeter SCPI Application to a Series 2600 System SourceMeter Script Application
应用指南 #2605 Increasing Production Throughput of Multi-pin Devices with Keithley Series 2600 System SourceMeter Instruments (also Applicable to Series 2600B)
应用指南 Keithley Model 26xxA Letter of Volatility/Memory Clearing/Declass
Letter of Volatility (LOV)/Data Destruction/Memory Clearing Keithley Model 77xx Letter of Volatility/Memory Clearing/Declass
Letter of Volatility (LOV)/Data Destruction/Memory Clearing
-
软件 文档类型 部件号： 发布日期 Series 2600B Firmware v4.0.8 and Release Notes -- Do not install on non-B
Series 2600B Firmware v4.0.8 and Release Notes -- Do not install on non-BThis firmware version is only compatible with instruments that are shipped with firmware version 4.0.1.Do not install on model 26xxA instruments. Do not install on instruments …固件 2600B-FRP-V4.0.8 KickStart Instrument Control Software version 2.11.3
KickStart Software for the PC enables quick test setup and data visualization when using one or more instruments. Key Features • Save time by automating data collection of millions of readings. • Set up a multi-instrument test with the ability to …应用 KICKSTART-2.11.3 KickStart Instrument Control Software version 2.11.2
KickStart Software for the PC enables quick test setup and data visualization when using one or more instruments. Key Features • Save time by automating data collection of millions of readings. • Set up a multi-instrument test with the ability to …应用 KICKSTART-2.11.2 Series 2600B Firmware v4.0.5 and Release Notes -- Do not install on non-B
Series 2600B Firmware v4.0.5 and Release Notes -- Do not install on non-B This firmware version is only compatible with instruments that are shipped with firmware version 4.0.1.Do not install on model 26xxA instruments. Do not install on instruments …固件 2600B-FRP-V4.0.5 Series 2600B Firmware v4.0.4 and Release Notes -- Do not install on non-B
Series 2600B Firmware v4.0.4 and Release Notes -- Do not install on non-B This firmware version is only compatible with instruments that are shipped with firmware version 4.0.1 Do not install on model 26xxA instruments. Do not install on instruments …固件 2600B-FRP-V4.0.4 Series 2600B Firmware v4.0.3 and Release Notes -- Do not install on non-B
Series 2600B Firmware v4.0.3 and Release Notes -- Do not install on non-B This firmware version is only compatible with instruments that are shipped with firmware version 4.0.1 Do not install on model 26xxA instruments. Do not install on instruments …固件 2600B-FRP-V4.0.3 Keithley I/O Layer version C10 (Windows 11, 10, 8, 7 Compatible)
Keithley I/O Layer version C10 (KIOL-850C10 adds support for Windows 10 and 11 Operating Systems and installs NI-VISA Runtime 17.5 and NI-ICP 17.0. This release replaces previous versions of KIOL-850B07, KIOL-850C02, KIOL-850C03, KIOL-850C04, KIOL …应用 KIOL-850C10 Series 2600B Firmware v3.4.2 and Release Notes -- Do not install on non-B
Series 2600B Firmware v3.4.0 and Release Notes -- Do not install on non-B This firmware version is only compatible with instruments that are model 26xxB. Do not install on model 26xxA instruments. This firmware version is only compatible with …固件 2600B-FRP-V3.4.2 KickStart Instrument Control Software Version 2.6.0 (Windows 10, 8, 7 compatible) (NOT SUPPORTED)
"KickStart Software for the PC enables quick test setup and data visualization when using one or more instruments.Key Features• Save time by automating data collection of millions of readings.• Set up a multi-instrument test with the ability to …应用 KICKSTART-2.6.0 Series 2600B Firmware v3.4.0 and Release Notes -- Do not install on non-B
Series 2600B Firmware v3.4.0 and Release Notes -- Do not install on non-B This firmware version is only compatible with instruments that are 26xxB. Do not install on 26xxA. This firmware version is only compatible with instruments that are shipped …固件 2600B-FRP-V3.4.0 Kickstart 仪器控制软件 2.5.0（Windows 10 8 7兼容）
"KickStart Software for the PC enables quick test setup and data visualization when using one or more instruments. Key Features • Save time by automating data collection of millions of …应用 IVI-COM Driver for Series 2600A/2600B System SourceMeters (KE26XXA IVI-COM Driver v1.9.0.0)
New Ke26XXA IVI Driver version 1.9.0.0 for 2600A/2600B Series Models (added support for new model 2601B-PULSE).驱动程序 2600A-IVI-1.9.0 Keithley Sequence Tools Library
This is a TSP script that installs support for list sweeps with an arbitrary mix of voltage and current steps on Series 2600B and 2650A SMU instruments.应用 2600B-SEQUENCE-V1.00 Series 2600B Firmware v3.3.5 and Release Notes -- Do not install on non-B
"Series 2600B Firmware v3.3.5 and Release Notes -- Do not install on non-B This firmware version is only compatible with instruments that are 26xxB. Do not install on 26xxA. This firmware version is only compatible with instruments that are shipped …固件 2600B-FRP-V3.3.5 IVI-COM Driver for Series 2600A/2600B System SourceMeters (KE26XXA IVI-COM Driver v1.8.0.0)
New Ke26XXA IVI Driver version 1.8.0.0 for 2600A/2600B Series Models (added support for new model 2606B).驱动程序 2600A-IVI-1.8.0 Keithley I/O Layer - version C07 (Windows 8, 7, Vista, and XP Compatible)
Keithley I/O Layer version C07 (KIOL-850C07 adds a change to only send the :syst:rem command to RS-232 connections This release replaces previous versions of KIOL-850B07, KIOL-850C02, KIOL-850C03, KIOL-850C04, KIOL-850C05, KIOL-850C06). This version …应用 KIOL-850C07 Series 2600A Firmware Version 2.2.6 and Release Notes -- DO NOT INSTALL ON NON-A
2600A-series V2.2.6 Firmware and Release Notes. Not for non-A versions of the instruments and not for 265XA versions of the instruments.固件 2600A-FRP-V2.2.6 Series 2600B Firmware V3.2.2 and Release Notes -- DO NOT INSTALL ON NON-B
This zip file contains version 3.2.2 of Series 2600B firmware and release notes. DO NOT install this firmware on 2600 non-B models! This firmware version is only compatible with instruments that are 26xxB. Do not install on 26xxA. This firmware …固件 2600B-FRP-V3.2.2 Series 2600B Firmware v3.2.1 and Release Notes -- Do not install on non-B
This zip file contains version 3.2.1 of Series 2600B firmware and release notes. DO NOT install this firmware on 2600 non-B models! This firmware version is only compatible with instruments that are 26xxB. Do not install on 26xxA. This firmware …固件 2600B-FRP-V3.2.1 Series 2600B Firmware v3.1.0 and Release Notes -- Do not install on non-B
This zip file contains version 3.1.0 of Series 2600B firmware and release notes. DO NOT install this firmware on 2600 non-B models! This firmware version is only compatible with instruments that are 26xxB. Do not install on 26xxA. This firmware …固件 2600B-FRP-V3.1.0 Series 2600B Firmware v3.0.4 and Release Notes -- Do not install on non-B
This zip file contains version 3.0.4 of Series 2600B firmware and release notes. This firmware version is only compatible with instruments that are 26xxB. Do not install on 26xxA. This firmware version is only compatible with instruments that are …固件 2600B-FRP-V3.0.4 Series 2600B Firmware v3.0.3 and Release Notes -- Do not install on non-B
This zip file contains version 3.0.3 of Series 2600B firmware and release notes. This firmware version is only compatible with instruments that are 26xxB. Do not install on 26xxA. This firmware version is only compatible with instruments that are …固件 2600B-FRP-V3.0.3 Series 2600B Firmware v3.0.1 and Release Notes -- Do not install on non-B
This zip file contains version 3.0.1 of Series 2600B firmware and release notes. This firmware version is only compatible with instruments that are 26xxB. Do not install on 26xxA. This firmware version is only compatible with instruments that are …固件 2600B-FRP-V3.0.1 TSP Script for Series 2600B SMUs to Emulate Model 2400 SMUs
TSP Script for Series 2600B SMUs to Emulate Model 2400 SMUs.应用 2600B-EMUL2400 Keithley Series 2600/2600A/2600B Native LabVIEW 2009 Instrument Driver version 2.5.0
Native LabVIEW Driver for 2600, 2600A, 2600B Series v2.5.0 (LabView 2009 or higher) (updated for new 2600B series models)驱动程序 2600-LV-2.5.0 IVI-COM Driver for Series 2600A/2600B System SourceMeters (KE26XXA IVI-COM Driver v1.4.5.0)
New Ke26XXA IVI Driver version 1.4.5.0 for 2600A/2600B Series Models(added support for new 2600B series models).驱动程序 2600A-IVI-1.4.5
-
常见问题 常见问题 ID 吉时利263X型源表：三同轴测试两端器件接线方法
首先介绍一下263X型源表背板上的三同轴接口构造。 三同轴转成鳄鱼夹的话，三个夹子的颜色对应的是：红色是最内部的芯线。黑色的是中间的一圈，绿色是最外的一圈。对2636的通道上的三个三同轴接口来说，绿色的都是机箱地。所有的测试一定要从Hi进从Lo出才能形成测试回路。 在进行两端器件测试接线的时候，一共有两种方式可以接，一种是需要用到2根三同轴转三鳄鱼夹的线，另一种只需用到一根三同轴线，但在仪器背板上需要做适当短接。 方法1、两根线，两根线都要接红的。注意看仪器背板的指示。这样是用两根线 …473381 吉时利2600SourceMeter SMU 仪器：内嵌式TSP Express软件使用说明
在我们2600系列的源表中内嵌有一款免费软件叫做TSP Express可以做I-V测试用。用网线把源表和电脑直连即可使用此软件。 以下，我就以2602双通道源表测试一个三极管举例软件使用方法。 所用试验设备：2602双通道源表一台、PC、网线、三极管NPN型S9013、面包板裸线若干。 硬件连接图如下： （注意：仪器背面板上有3个类似于网口的口，其中，左面那个如图，我连着蓝色网线的口才是网络口LAN口，右边两个类似于网络口的TSP …473406 吉时利2400、2600型SourceMeter SMU 仪器：如何去掉热电动势的影响
电流相反法：使用极性相反的两种电流进行两次测试，计算而得的阻值可以抵消热电动势的影响。如图6所示， 其中： I为激励电流 VM+ 和VM-为万用表测得的电压 VEMF为热电动势 R为被测电阻 根据图6的电路图我们可以列出两个方程：VM+=VEMF+I*R ；VM-=VEMF-I*R，计算可得不含热电动势的VM=（VM+-VM-）/2, 带入欧姆定律既可得到被测电阻阻值R=VM/I。 以吉时利源表2400举例 2400源表能实现四象限测量，即正向电流、负向电流、正向电压、负向电压 …473386 2600SourceMeter SMU 仪器，使用网线连接，无法找到仪器时，该如何操作
打开NI max (到NI网站一下载NI visa安装，也可以用其他的客户端工具) 点击添加网络设备 选择自动发现设备，点下一步 Navigate to the latest instrument discovery log file. Go to My Documents - Keithley Instruments - KickStart - Log. Open the most recent file and at the top of the file, you …473226 为何吉时利源表无法加载设定的电压?
当2线接入被测件，回测电压始终小于设定的加载电压 需要确认接入测量端的阻抗和仪器的阻抗，确定输出所需的功率（仪器可能无法达到被测件需要加载的电压值）；建议使用4线制加载电压（跟踪输出）。473411 Does Kickstart support the 2600? The 2600A or 2600B?
Keithley's Kickstart software supports the 2600A and 2600B Source Measure Unit models. Kickstart does not work with the non-A or non-B 2600 instrument models. This applies for version 1.9.8+255366 How do I create an I-V Characterizer test that uses more than one SMU Instrument?
Use the “Instruments” button in the I-V Characterizer app toolbar to access the “Add Channels” button to add more SMU instruments to your test. You can add up to 4 SMU instruments in a single I-V Characterizer app.470091
